JEOL: Launch of the New Benchtop Scanning Electron Microscope “JCM-7000Plus NeoScope™”
TOKYO — JEOL Ltd. (President & CEO: Izumi Oi) has developed the benchtop scanning electron microscope (SEM) “JCM-7000Plus” and will begin sales on September 1, 2026. [Development Background] Benchtop scanning electron microscopes are increasingly used in fields including electric…
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